1-858-675-7404       contact@surfaceoptics.com     

Two evolutionary algorithms optimize clusters and automate feature selection in multispectral images

Evolutionary computation can increase the speed and accuracy of pattern recognition in multispectral images, for example, in automatic target tracking. The first method treats the clustering process. It determines a cluster of pixels around specified reference pixels so that the entire cluster is increasingly representative of the search object. An initial population (of clusters) evolves into populations of new clusters, with each cluster having an assigned fitness score. This population undergoes iterative mutation and selection. Mutation operators alter both the pixel cluster set cardinality and composition. Several stopping criteria can be applied to terminate the evolution. An advantage of this evolutionary cluster formulation is that the resulting cluster may have an arbitrary shape so that it most nearly fits the search pattern. The second algorithm automates the selection of features (the center-frequency and the bandwidth) for each population member. For each pixel in the image and for each population member, the Mahalanobis distance to the reference set is calculated and a decision is made whether or not this pixel belongs to a target. The sum of correct and false decisions defines a Receiver Operating Curve, which is used to measure the fitness of a population member. Based on this fitness, the algorithm decides which population members to use as parents for the next iteration.

Two evolutionary algorithms optimize clusters and automate feature selection in multispectral images

George H. BurginH. Price Kagey, and James C. Jafolla “Two evolutionary algorithms optimize clusters and automate feature selection in multispectral images”, Proc. SPIE 6700, Mathematics of Data/Image Pattern Recognition, Compression, Coding, and Encryption X, with Applications, 67000E (17 September 2007); https://doi.org/10.1117/12.732211

 

Copyright 2007 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.