The advancement of computer simulation tools for high fidelity signature modeling has led to a requirement for a better understanding of effects of light scattering from surfaces. Measurements of the Bidirectional Reflectance Distribution Function (BRDF) fully describe the angular scattering properties of materials, and these may be used in signature simulations to quantitatively characterize the optical effects of surface treatments on targets. This paper reviews the theoretical and experimental techniques for characterizing the BRDF of surfaces and examines some of the popular parameterized BRDF representations that are used in signature calculations.
Bidirectional reflectance measurements for high-resolution signature modeling
Bidirectional reflectance measurements for high-resolution signature modeling
James C. Jafolla and William R. Reynolds “Bidirectional reflectance measurements for high-resolution signature modeling”, Proc. SPIE 5431, Targets and Backgrounds X: Characterization and Representation, (5 August 2004); https://doi.org/10.1117/12.548085Copyright 2004 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.