
Bidirectional reflectance measurements for high-resolution signature modeling
August 5, 2004
The advancement of computer simulation tools for high fidelity signature modeling has led to a requirement for a better understanding of effects of light scattering from surfaces. Measurements of the Bidirectional Reflectance Distribution Function (BRDF) fully describe the angular scattering properties of materials, and these may be used in signature simulations to quantitatively characterize the […]