Extended performance infrared directional reflectometer for the measurement of total, diffuse and specular reflectance
October 7, 1994
This paper presents a description of a fully automated, computer-controlled Hemispherical Directional Reflectometer (HDR). It fills the need in many fields of research and development for a device with HDR measurement capabilities which is state-of-the-art in wavelength coverage to 25.0 μm and higher, angular polarization resolved coverage 20 to 80 degrees, partition of reflected radiation […]
