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SOC-100 HDR Hemispherical Directional Reflectometer

Coupled to the Thermo Scientific™ Nicolet™ iS50 FTIR Spectrometer, the SOC-100 provides polarized, angular diffuse reflectance measurements from 8° to 80° incident angles, for the entire spectral region covered by the FTIR. The spectral region is nominally 2.0 to 25.0 μm using the standard FTIR optics, and can be extended to 200 μm using mid-/far-IR optics.

Traditional techniques for measuring the diffuse reflectance of materials use an integrating sphere to capture the diffusely scattered energy. Because of energy considerations inherent to integrating spheres, useful measurement data is limited to about 14 μm. The SOC-100 uses a 2π imaging hemiellipsoid to illuminate the sample using a 700°C blackbody. A movable overhead mirror captures the energy reflected at angle and directs a collimated beam into the FTIR. This measurement of the hemispherical directional reflectance (HDR) is identical, by the reciprocity theorem, to the directional hemispherical reflectance (DHR).

Applications

  • Emittance as a function of temperature and wavelength for heat transfer analysis
  • Provides full scattered transmittance data into large angles up to a hemisphere of 2π steradians.
  • Support of IR image simulation and IR material development
  • Identification and measurement of surface contaminants
  • Characterization of scatter and degree of specularity
  • Measurement of polarized reflectance data for calculation of optical constants (n, k) of bulk and powdered materials

Data

  • Parallel, perpendicular & unpolarized reflectance at 12 user
    selected angles between 8° and 80°.
  • Separation of the reflectance into diffuse and specular components.
  • Collimated and scattered transmittance at 0° incidence.
  • Directional emittance as a function of wavelength and temperature beyond 500°C.
  • Total hemispherical emittance as a function of temperature.
  • Data format selection: ERAS, ASTM tabular formats, graphical, linear
    and log scale, μm or cm-1, reflectance vs. wavelength,
    and reflectance vs. angle.

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