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Archive for the ‘Reflectometers’ Category

Surface Optics Corporation Presents at the 13th International IR Target and Background Modeling & Simulation Workshop

June 13, 2018

Dr. James Jafolla, President of Surface Optics Corporation, presented today at the 13th International IR Target and Background Modeling & Simulation Workshop (ITBMS) convened in Banyuls-sur-mer, France. The ITBMS workshop is a forum for the IR modeling and simulation community to discuss current developments in their field of expertise. Dr. Jafolla’s presentation was titled, “The Prediction and Measurement of the Optical Properties of Complex Surfaces.”

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Measurement and analysis of optical surface properties for input to ShipIR

April 22, 2009

The application of advanced low observable treatments to ground vehicles has led to a requirement for a better understanding of effects of light scattering from surfaces. Measurements of the Bidirectional Reflectance Distribution Function (BRDF) fully describe the angular scattering properties of materials, and these may be used in signature simulations to quantitatively characterize the optical […]

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Extended performance infrared directional reflectometer for the measurement of total, diffuse and specular reflectance

October 7, 1994

This paper presents a description of a fully automated, computer-controlled Hemispherical Directional Reflectometer (HDR). It fills the need in many fields of research and development for a device with HDR measurement capabilities which is state-of-the-art in wavelength coverage to 25.0 μm and higher, angular polarization resolved coverage 20 to 80 degrees, partition of reflected radiation […]

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