Archive for the ‘Measurement Services’ Category

3D visualization of bidirectional reflectance distribution function of a machine learning designed metasurface material

A New AI-Powered Method for Designing Infrared Metasurfaces

Metasurfaces are a revolutionary development in the world of optics. These are extremely sophisticated, customizable surfaces that have been tailored to reflect, absorb, or transmit light based on the designer’s needs. The complex structures on the material’s surface are of a sub-wavelength scale compared to the wavelength of interest. These structures act as “mini transmitters […]

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Solar Reflectance & SRI Measurements for LEED

Building designers and developers that are pursuing the Heat island reduction credit for LEED certification require documentation of the Solar Reflectance Index (SRI) for their project’s roofing materials, shade giving structures, and paving materials. Under the U.S. Green Building Council’s LEED 2009 rating system, credits SSc7.1 and SSc7.2 (combined as credit SSc5 in LEED v4) […]

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Optical Measurement of Z93 Thermal Coating on the International Space Station

Space-based construction materials must meet a range of requirements: mechanical robustness, lightweight characteristics, and tolerance to heat. There are three optical requirements for heat management to protect sensitive instrumentation and personnel: high solar reflectance, high thermal emissivity, and a sufficiently diffuse surface. These properties ensure that the spacecraft will remain cool, and the thermal control […]

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The Prediction and Measurement of the Optical Properties of Complex Surfaces

Determining the optical properties of complex surfaces for signature analysis can be problematic. Materials with surface structures, e.g, crinkled or patterned foil appliques, or striated or ribbed surfaces will produce a non-isotropic BRDF, which can be difficult to measure and represent in signature models. This paper will describe an analytical approach to predicting the optical […]

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Surface Optics Corporation Presents at the 13th International IR Target and Background Modeling & Simulation Workshop

Dr. James Jafolla, President of Surface Optics Corporation, presented today at the 13th International IR Target and Background Modeling & Simulation Workshop (ITBMS) convened in Banyuls-sur-mer, France. The ITBMS workshop is a forum for the IR modeling and simulation community to discuss current developments in their field of expertise. Dr. Jafolla’s presentation was titled, “The Prediction and Measurement of the Optical Properties of Complex Surfaces.”

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SOC President, Dr. James Jafolla, to give lecture at Georgia Tech on signature control techniques and optical properties of materials

Dr. Jafolla will be participating as an instructor in the course “Infrared/Visible Signature Suppression” offered by the Georgia Institute of Technology (Atlanta, GA), Sept. 11-14, 2012. Course lectures will examine threat characteristics to derive signature vulnerabilities, suppression strategies, and priorities. Explore signature-generation mechanisms and modeling techniques, as well as special types of challenges posed by […]

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Measurement and analysis of optical surface properties for input to ShipIR

The application of advanced low observable treatments to ground vehicles has led to a requirement for a better understanding of effects of light scattering from surfaces. Measurements of the Bidirectional Reflectance Distribution Function (BRDF) fully describe the angular scattering properties of materials, and these may be used in signature simulations to quantitatively characterize the optical […]

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Bidirectional reflectance measurements for high-resolution signature modeling

The advancement of computer simulation tools for high fidelity signature modeling has led to a requirement for a better understanding of effects of light scattering from surfaces. Measurements of the Bidirectional Reflectance Distribution Function (BRDF) fully describe the angular scattering properties of materials, and these may be used in signature simulations to quantitatively characterize the […]

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Extended performance infrared directional reflectometer for the measurement of total, diffuse and specular reflectance

This paper presents a description of a fully automated, computer-controlled Hemispherical Directional Reflectometer (HDR). It fills the need in many fields of research and development for a device with HDR measurement capabilities which is state-of-the-art in wavelength coverage to 25.0 μm and higher, angular polarization resolved coverage 20 to 80 degrees, partition of reflected radiation […]

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